Tc max
14.8 K
Tc ambient
—
arXiv year
2012
Papers
2
Tc exp.
14.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, microwave, arXiv:1205.2463, confirmed by 2 papers
Evidence (5 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 14.8 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 11.9 | — | thin_film | microwave | s-wave | 2012 | — | 1205.2463 |
| 4.3 | — | thin_film | resistivity | — | 2017 | T1 | 1707.09679 |
| 3.4 | — | thin_film | resistivity | — | 2017 | T1 | 1707.09679 |
| 0.3 | — | thin_film | resistivity | — | 2017 | T1 | 1707.09679 |
Structure
- Crystal structure
- rock-salt
- Lattice a (Å)
- 4.330
Superconducting parameters
- Hc2
- 12.0 T (0 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Sapphire