Tc max
10.4 K
Tc ambient
10.4 K
arXiv year
2017
Papers
2
Tc exp.
10.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.97.144518, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 10.4 | — | thin_film | resistivity | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.97.144518 |
| 10.4 | — | thin_film | resistivity | s-wave | 2017 | T1 | 1711.04585 |
Structure
- Crystal structure
- cubic
- Lattice a (Å)
- 4.336
Superconducting parameters
- Pairing symmetry
- s-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Al2O3
- Doping level
- 0.140