Tc max
8.5 K
Tc ambient
—
arXiv year
2013
Papers
3
Tc exp.
8.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.111.057002
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 8.5 | — | thin_film | resistivity | s-wave | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.057002 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1909.00051 |
| — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- AlN