Tc max
0.8 K
Tc ambient
—
arXiv year
2011
Papers
3
Tc exp.
0.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1102.5516
Evidence (5 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.8 | — | thin_film | resistivity | — | 2011 | T1 | 1102.5516 |
| 0.6 | — | thin_film | resistivity | — | 2011 | T1 | 1102.5516 |
| 0.2 | — | thin_film | resistivity | — | 2011 | T1 | 1102.5516 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.144514 |
| — | — | thin_film | resistivity | — | 2013 | T1 | 1304.4629 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire