Tc max
0.5 K
Tc ambient
0.5 K
arXiv year
2019
Papers
4
Tc exp.
0.5 K
Tc theo.
6.1 K
Evidence
mixed
Tc max measured at thin_film, arXiv:2203.14083
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.1 | — | — | — | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.064505 |
| 0.6 | — | — | — | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.064505 |
| 0.5 |
Structure
- Crystal structure
- hexagonal
- Space group
- P3¯1m
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- c-plane sapphire