Tc max
20.6 K
Tc ambient
2.9 K
arXiv year
1986
Papers
8
Tc exp.
20.6 K
Tc theo.
25.5 K
Evidence
experimental
Tc max measured at thin_film, susceptibility, DOI: 10.1103/PhysRevB.33.4557, confirmed by 2 papers
Evidence (13 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.5 | — | — | — | — | 2026 | T3 | 2604.04719 |
| 24.0 | — | thin_film | — | — | 1999 | T3 | cond-mat/9909358 |
| 20.6 | — |
Structure
- Crystal structure
- A15
- Space group
- Pm3n
- Lattice a (Å)
- 5.140
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si