Tc max
20.6 K
Tc ambient
2.9 K
arXiv year
1986
Papers
8
Tc exp.
20.6 K
Tc theo.
25.5 K
Evidence
experimental
Tc max measured at thin_film, susceptibility, DOI: 10.1103/PhysRevB.33.4557, confirmed by 2 papers
Evidence (13 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.5 | — | — | — | — | 2026 | T3 | 2604.04719 |
| 24.0 | — | thin_film | — | — | 1999 | T3 | cond-mat/9909358 |
| 20.6 | — | thin_film | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevB.68.104507 |
| 20.6 | — | thin_film | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4557 |
| 20.3 | — | thin_film | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4557 |
| 20.2 | — | thin_film | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4557 |
| 18.4 | — | thin_film | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4557 |
| 16.1 | — | thin_film | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.4557 |
| 15.3 | — | — | — | — | 2023 | T1 | 2310.18245 |
| 2.9 | ambient | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevB.55.15183 |
| 2.9 | — | thin_film | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.57.1206 |
| 2.7 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.13013 |
| 2.7 | ambient | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevB.55.15183 |
Structure
- Crystal structure
- A15
- Space group
- Pm3n
- Lattice a (Å)
- 5.140
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si