Tc max
5.7 K
Tc ambient
5.7 K
arXiv year
1987
Papers
2
Tc exp.
5.7 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.35.55
Evidence (7 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.7 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.55 |
| 3.7 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.55 |
| 2.8 |
Structure
- Crystal structure
- A15
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire