Tc max
18.1 K
Tc ambient
18.1 K
arXiv year
1987
Papers
78
Tc exp.
18.1 K
Tc theo.
22.0 K
Evidence
experimental
Tc max measured at polycrystal, resistivity, arXiv:1006.3124, confirmed by 3 papers
Evidence (94 records from 78 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.6 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 22.0 | — | — | — | s-wave | 2025 | T2 | 2509.07307 |
| 20.7 | — | — | — | — | 2023 | T1 | 2304.14682 |
| 18.4 | — | wire | specific_heat | — | 2013 | T1 | 1301.5251 |
| 18.3 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 18.2 | — | wire | specific_heat | — | 2013 | T1 | 1301.5251 |
| 18.1 | — | polycrystal | resistivity, susceptibility | s-wave | 2010 | T1 | 1006.3124 |
| 18.1 | — | polycrystal | susceptibility, resistivity | s-wave | 2010 | T1 | DOI: 10.1103/PhysRevB.82.024507 |
| 18.0 | — | polycrystal | specific_heat | — | 2026 | T1 | DOI: 10.1103/3q2z-gb8k |
| 18.0 | — | — | — | s-wave | 2025 | T2 | 2509.07307 |
| 18.0 | ambient | wire | — | — | 2015 | T1 | 1510.07590 |
| 18.0 | — | thin_film | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevSTAB.17.112001 |
| 18.0 | — | wire | specific_heat | — | 2013 | T1 | 1301.5251 |
| 18.0 | — | single_crystal | specific_heat | — | 2012 | T1 | 1203.1848 |
| 18.0 | ambient | single_crystal | resistivity | — | 2011 | — | 1110.4388 |
| 18.0 | ambient | single_crystal | resistivity | — | 2009 | T1 | 0910.1270 |
| 18.0 | — | single_crystal | specific_heat | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.094503 |
| 18.0 | ambient | polycrystal | specific_heat | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.224512 |
| 18.0 | — | single_crystal | specific_heat, susceptibility | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.104502 |
| 18.0 | — | thin_film | resistivity | s-wave | 2005 | T1 | DOI: 10.1103/PhysRevB.72.094502 |
| 18.0 | ambient | polycrystal | specific_heat | — | 2004 | T1 | cond-mat/0403590 |
| 18.0 | — | polycrystal | susceptibility | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.1244 |
| 18.0 | — | thin_film | specific_heat | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.107 |
| 17.9 | — | thin_film | — | — | 2020 | T1 | 2004.10921 |
| 17.9 | — | single_crystal | susceptibility | s-wave | 2006 | T2 | cond-mat/0605718 |
| 17.8 | — | thin_film | resistivity | — | 2020 | T1 | 2007.07103 |
| 17.8 | — | wire | specific_heat | — | 2013 | T1 | 1301.5251 |
| 17.8 | — | polycrystal | resistivity | — | 2004 | T1 | cond-mat/0410463 |
| 17.8 | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0211349 |
| 17.8 | — | thin_film | resistivity | — | 2021 | T1 | 2109.07066 |
| 17.7 | — | — | — | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.184503 |
| 17.6 | — | thin_film | resistivity, susceptibility | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.054506 |
| 17.6 | — | thin_film | resistivity, susceptibility | — | 2022 | T1 | 2211.11537 |
| 17.6 | — | thin_film | resistivity | — | 2021 | T1 | 2109.07066 |
| 17.5 | — | thin_film | resistivity | — | 2023 | T2 | 2301.00756 |
| 17.4 | — | thin_film | — | — | 2020 | T1 | 2007.07103 |
| 17.4 | — | polycrystal | specific_heat | — | 2026 | T1 | DOI: 10.1103/3q2z-gb8k |
| 17.3 | — | — | — | — | 2026 | T3 | 2604.04719 |
| 17.2 | — | thin_film | resistivity | — | 2020 | T1 | 2007.07103 |
| 17.2 | — | powder | — | — | 2023 | T1 | 2311.00841 |
| 17.2 | — | thin_film | resistivity | s-wave | 2022 | T1 | DOI: 10.1103/PhysRevResearch.4.013156 |
| 17.2 | — | thin_film | resistivity | s-wave | 2022 | T1 | 2202.06107 |
| 17.2 | — | wire | resistivity | — | 2013 | T1 | 1311.6901 |
| 16.3 | — | thin_film | STM | — | 2015 | T1 | 1503.03410 |
| 16.0 | — | thin_film | — | — | 2020 | T1 | 2007.07103 |
| 16.0 | — | — | — | s-wave | 2025 | T2 | 2509.07307 |
| 16.0 | — | powder | susceptibility | — | 2023 | T1 | 2311.00841 |
| 16.0 | — | thin_film | susceptibility | s-wave | 2019 | T1 | DOI: 10.1103/PhysRevB.100.054504 |
| 16.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.094504 |
| 16.0 | — | thin_film | resistivity | — | 2018 | — | 1808.06731 |
| 15.7 | — | — | — | — | 2023 | T1 | 2310.18245 |
| 15.6 | — | thin_film | — | — | 2025 | T2 | 2511.15116 |
| 15.1 | — | thin_film | — | — | 2025 | T2 | 2511.15116 |
| 14.6 | — | thin_film | — | — | 2025 | T2 | 2511.15116 |
| 14.5 | — | powder | susceptibility | — | 2023 | T1 | 2311.00841 |
| 11.8 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 5.0 | — | — | — | — | 2020 | — | 2003.03362 |
| 4.0 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.20.014055 |
| 4.0 | — | thin_film | resistivity | — | 2022 | T1 | 2211.13340 |
| — | — | thin_film | resistivity | — | 2026 | T3 | 2603.00954 |
| — | — | thin_film | susceptibility | — | 2026 | T1 | 2603.18351 |
| — | ambient | — | — | — | 2026 | T2 | 2601.13292 |
| — | ambient | thin_film | resistivity | — | 2026 | T1 | 2603.19027 |
| — | — | wire | magnetization | — | 2026 | T1 | 2601.09945 |
| — | — | wire | magnetization | — | 2024 | T1 | 2403.07666 |
| — | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.20.034004 |
| — | — | — | resistivity | — | 2023 | T1 | 2302.02054 |
| — | — | polycrystal | resistivity | — | 2021 | T1 | 2112.12775 |
| — | — | polycrystal | resistivity | — | 2020 | — | 2008.11656 |
| — | — | polycrystal | resistivity | — | 2019 | T1 | 1901.03819 |
| — | — | wire | resistivity | — | 2019 | T1 | 1903.08121 |
| — | — | wire | resistivity | — | 2019 | T3 | 1909.13543 |
| — | — | — | — | — | 2018 | T1 | 1808.01293 |
| — | — | wire | — | — | 2018 | T1 | 1810.10569 |
| — | — | wire | resistivity | — | 2018 | T1 | 1811.08867 |
| — | — | wire | susceptibility | — | 2016 | T1 | 1611.01933 |
| — | — | — | resistivity, susceptibility | — | 2016 | T1 | 1701.00446 |
| — | ambient | single_crystal | resistivity | — | 2016 | T1 | 1602.06398 |
| — | ambient | wire | resistivity | — | 2015 | T1 | 1504.05366 |
| — | — | — | resistivity | — | 2015 | T1 | 1512.06416 |
| — | — | wire | — | — | 2014 | — | 1408.0353 |
| — | — | — | — | — | 2013 | T3 | 1309.3239 |
| — | — | single_crystal | susceptibility | — | 2013 | T1 | 1304.4744 |
| — | — | thin_film | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.045437 |
| — | — | — | — | — | 2011 | — | 1102.5118 |
| — | — | single_crystal | specific_heat, resistivity, susceptibility | — | 2009 | T1 | 0907.0411 |
| — | — | — | specific_heat | — | 2006 | T1 | cond-mat/0604098 |
| — | — | single_crystal | susceptibility, specific_heat | — | 2006 | T1 | cond-mat/0604176 |
| — | — | polycrystal | — | — | 2005 | — | cond-mat/0511560 |
| — | — | — | — | — | 2003 | T1 | cond-mat/0308363 |
| — | — | — | — | — | 2002 | T3 | cond-mat/0201048 |
| — | — | wire | susceptibility | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.16176 |
| — | — | wire | susceptibility | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.4208 |
| — | — | wire | resistivity, susceptibility | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.9350 |
Structure
- Crystal structure
- A15
- Space group
- P m-3n
- Lattice a (Å)
- 5.290
Superconducting parameters
- Pairing symmetry
- s-wave
- Hc2
- 35.0 T (calculated, clean limit, T=0 K, neglecting Pauli limiting)
- λ_eph (e–ph coupling)
- 2.08
- ω_log
- 176 K
Competing orders
- Competing order
- CDW
- T_CDW
- 50.0 K
Samples & pressure
- Substrate
- Si(100)
- Pressure type
- none
- Doping type
- none