Tc max
2.9 K
Tc ambient
2.7 K
arXiv year
2003
Papers
6
Tc exp.
2.9 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, DOI: 10.1103/PhysRevB.81.184503, confirmed by 2 papers
Evidence (6 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.0 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0304046 |
| 2.9 | — | thin_film | — | — | 2010 | T1 | DOI: 10.1103/PhysRevB.81.184503 |
| 2.9 | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si