Tc max
16.8 K
Tc ambient
16.8 K
arXiv year
1987
Papers
358
Tc exp.
16.5 K
Tc theo.
18.2 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0907.4735, confirmed by 10 papers
Evidence (559 records from 358 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 20.0 | — | — | — | — | 2025 | — | 2507.03417 |
| 18.2 | — | — | — | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.104508 |
| 17.1 | — | thin_film | resistivity |
Structure
- Crystal structure
- B1
- Space group
- Pm3m
- Lattice a (Å)
- 4.330
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 50.0 T (nanoconfinement-induced)
- λ_eph (e–ph coupling)
- 1.10
- ω_log
- 373 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- GaN
- Pressure type
- none
- Doping type
- none
- Doping level
- 0.000