Tc max
1.5 K
Tc ambient
1.5 K
arXiv year
1992
Papers
4
Tc exp.
1.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, resistivity, DOI: 10.1103/PhysRevB.46.14001
Evidence (7 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.5 | — | single_crystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.46.14001 |
| 1.4 | — | thin_film | resistivity | — | 2025 | T1 | 2505.14997 |
| 1.3 |
Structure
- Crystal structure
- cubic
- Lattice a (Å)
- 4.210
Superconducting parameters
- Hc2
- 0.1 T (0 K)
- λ_eph (e–ph coupling)
- 0.51
- ω_log
- 405 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- Al2O3