Tc max
2.4 K
Tc ambient
2.4 K
arXiv year
1995
Papers
2
Tc exp.
2.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.75.2586, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.4 | — | thin_film | resistivity | — | 2002 | T3 | cond-mat/0202336 |
| 2.4 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevLett.75.2586 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film