Tc max
8.1 K
Tc ambient
4.2 K
arXiv year
1986
Papers
4
Tc exp.
8.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.36.815
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 8.1 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.815 |
| 7.7 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.815 |
| 4.2 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- sapphire