Tc max
9.6 K
Tc ambient
9.6 K
arXiv year
1991
Papers
27
Tc exp.
9.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, resistivity, arXiv:1808.07215, confirmed by 2 papers
Evidence (27 records from 27 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 9.6 | — | polycrystal | susceptibility | — | 2026 | T1 | DOI: 10.1103/lq5f-lvh7 |
| 9.6 | ambient | — | resistivity | — | 2018 | — | 1808.07215 |
| 9.0 | — | wire | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevLett.74.805 |
| 9.0 | — | polycrystal | — | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.2916 |
| 8.8 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/zhzr-bxy1 |
| 8.0 | — | — | resistivity | — | 2024 | T1 | 2408.10719 |
| 7.7 | — | — | resistivity | — | 2017 | — | 1611.10166 |
| 7.5 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevResearch.6.043114 |
| 7.5 | — | wire | susceptibility | — | 2012 | T3 | 1207.6901 |
| 6.8 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevLett.77.4078 |
| 5.5 | — | thin_film | resistivity | — | 2023 | T1 | 2303.13922 |
| — | — | — | — | — | 2025 | T1 | 2509.00563 |
| — | — | — | — | — | 2025 | T3 | 2509.20782 |
| — | — | thin_film | — | — | 2025 | T1 | 2509.01447 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2408.04516 |
| — | — | wire | — | — | 2023 | T1 | 2302.07827 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2112.12775 |
| — | — | wire | resistivity | — | 2021 | T1 | 2102.11460 |
| — | — | wire | resistivity | — | 2021 | T1 | 2104.13596 |
| — | — | — | — | — | 2021 | T1 | 2109.15071 |
| — | — | — | — | — | 2019 | T1 | 1912.10794 |
| — | — | polycrystal | resistivity | — | 2016 | T1 | 1612.07977 |
| — | — | wire | — | — | 2006 | T1 | DOI: 10.1103/PhysRevLett.97.200405 |
| — | — | polycrystal | susceptibility | — | 2001 | T1 | cond-mat/0106379 |
| — | — | wire | susceptibility, resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.15429 |
| — | — | wire | STM | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.15128 |
| — | — | wire | susceptibility | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.7689 |
Superconducting parameters
- Hc2
- 15.4 T (1.8 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- copper