Tc max
15.7 K
Tc ambient
15.7 K
arXiv year
2006
Papers
69
Tc exp.
15.7 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, arXiv:2303.17348, confirmed by 4 papers
Evidence (82 records from 69 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.0 | — | thin_film | resistivity | — | 2023 | T2 | 2308.12090 |
| 15.7 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/7j1s-ww78 |
| 15.7 | — |
Structure
- Crystal structure
- FCC
Superconducting parameters
- Hc2
- 11.0 T (perpendicular to the sample)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si
- Pressure type
- none
- Doping type
- none