Tc max
15.7 K
Tc ambient
15.7 K
arXiv year
2006
Papers
66
Tc exp.
15.7 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, arXiv:2303.17348, confirmed by 4 papers
Evidence (79 records from 66 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.0 | — | thin_film | resistivity | — | 2023 | T2 | 2308.12090 |
| 15.7 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/7j1s-ww78 |
| 15.7 | — | thin_film | — | — | 2023 | T1 | 2303.17348 |
| 15.7 | ambient | thin_film | resistivity | — | 2016 | T1 | 1609.01265 |
| 15.6 | — | — | — | — | 2021 | T1 | 2103.04777 |
| 15.6 | — | thin_film | — | — | 2021 | T1 | DOI: 10.1103/PhysRevB.104.L180506 |
| 15.5 | — | thin_film | resistivity | — | 2010 | — | 1005.5394 |
| 15.2 | — | thin_film | resistivity | — | 2022 | T1 | 2207.05534 |
| 15.2 | — | thin_film | resistivity | — | 2016 | T1 | 1609.01526 |
| 15.1 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevApplied.16.014019 |
| 15.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/7j1s-ww78 |
| 15.0 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevApplied.16.014019 |
| 15.0 | — | thin_film | — | — | 2006 | T1 | cond-mat/0605753 |
| 14.8 | — | thin_film | resistivity | — | 2010 | — | 1005.5394 |
| 14.8 | — | thin_film | resonance_frequency | — | 2008 | T1 | 0804.3499 |
| 14.7 | — | thin_film | resistivity | — | 2010 | T1 | 1005.0408 |
| 14.3 | — | thin_film | — | — | 2023 | — | 2311.14154 |
| 14.2 | — | thin_film | — | — | 2023 | T1 | 2303.17348 |
| 14.2 | — | — | resistivity | — | 2013 | T1 | 1303.7151 |
| 14.0 | — | thin_film | — | — | 2022 | T1 | 2208.13379 |
| 14.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevApplied.11.064053 |
| 13.9 | — | thin_film | — | — | 2023 | T1 | 2303.17348 |
| 13.8 | — | — | — | — | 2015 | T1 | 1507.05126 |
| 13.7 | — | thin_film | — | — | 2012 | T1 | 1206.0579 |
| 13.6 | — | thin_film | resistivity | — | 2010 | T1 | 1005.0408 |
| 13.6 | — | thin_film | resistivity | — | 2010 | — | 1005.5394 |
| 13.5 | — | thin_film | resistivity | — | 2025 | — | 2503.14457 |
| 13.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/7j1s-ww78 |
| 13.0 | — | thin_film | — | — | 2023 | T1 | 2303.17348 |
| 13.0 | — | thin_film | — | — | 2014 | T1 | 1405.7117 |
| 13.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.205404 |
| 12.8 | — | thin_film | — | — | 2023 | T1 | 2303.17348 |
| 12.6 | — | thin_film | resistivity | — | 2025 | — | 2503.14457 |
| 12.3 | — | thin_film | resistivity | — | 2025 | T1 | 2509.07870 |
| 11.8 | — | thin_film | — | — | 2018 | T1 | 1810.04070 |
| 11.5 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/7j1s-ww78 |
| 11.0 | — | thin_film | resistivity | — | 2026 | T1 | 2602.13456 |
| 10.7 | — | thin_film | resistivity | — | 2025 | T1 | 2512.01379 |
| 10.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.054504 |
| 10.0 | — | thin_film | resistivity | — | 2026 | T1 | 2602.14330 |
| 9.7 | ambient | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.19.034024 |
| 9.5 | — | thin_film | resistivity | — | 2012 | T1 | 1203.4253 |
| 9.5 | — | thin_film | resistivity | — | 2012 | T1 | 1212.3984 |
| 9.3 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevApplied.5.044004 |
| 9.1 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/cxv8-fqy9 |
| 9.1 | — | thin_film | resistivity | — | 2024 | T1 | 2411.09494 |
| 8.4 | — | thin_film | resistivity | — | 2013 | T1 | 1305.5832 |
| 8.4 | — | thin_film | resistivity | — | 2012 | T1 | 1205.4290 |
| 6.6 | — | thin_film | resistivity | — | 2012 | T1 | 1202.4774 |
| 4.6 | — | thin_film | resistivity | — | 2025 | T1 | 2512.01379 |
| 1.8 | — | thin_film | resistivity | — | 2025 | — | 2505.09547 |
| — | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/fnfl-xjrz |
| — | — | thin_film | — | — | 2026 | T1 | 2603.08500 |
| — | — | thin_film | — | — | 2025 | T1 | DOI: 10.1103/f81h-xjcv |
| — | — | thin_film | — | — | 2025 | T1 | DOI: 10.1103/sv4y-qps6 |
| — | — | — | — | — | 2025 | T3 | 2509.20782 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2402.11720 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2408.15959 |
| — | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.035430 |
| — | — | single_crystal | — | — | 2024 | T1 | DOI: 10.1103/PhysRevApplied.22.054043 |
| — | — | thin_film | — | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.134506 |
| — | — | thin_film | resistivity | — | 2023 | T3 | 2309.01856 |
| — | — | thin_film | resistivity, susceptibility | — | 2023 | T3 | 2303.14673 |
| — | — | — | — | — | 2023 | T1 | 2305.02418 |
| — | — | thin_film | resistivity | — | 2022 | T3 | 2203.14586 |
| — | — | — | resistivity | — | 2022 | T1 | 2208.10101 |
| — | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.18.064003 |
| — | — | thin_film | — | — | 2022 | T1 | DOI: 10.1103/PhysRevLett.129.107701 |
| — | — | — | resistivity | — | 2022 | T1 | 2207.12060 |
| — | — | thin_film | — | — | 2021 | T1 | DOI: 10.1103/PhysRevApplied.15.054001 |
| — | — | thin_film | — | — | 2021 | T3 | 2110.01305 |
| — | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevA.101.042336 |
| — | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.121.127705 |
| — | — | thin_film | resistivity | — | 2017 | T1 | 1801.00306 |
| — | — | thin_film | — | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.094508 |
| — | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevLett.119.187704 |
| — | — | — | — | — | 2014 | T1 | DOI: 10.1103/PhysRevB.90.205435 |
| — | — | thin_film | — | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.067004 |
| — | — | thin_film | resistivity | s-wave | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.107003 |
Structure
- Crystal structure
- FCC
Superconducting parameters
- Hc2
- 11.0 T (perpendicular to the sample)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- lithium niobate
- Pressure type
- none
- Doping type
- none