Tc max
5.1 K
Tc ambient
5.1 K
arXiv year
2020
Papers
4
Tc exp.
5.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2402.14559, confirmed by 2 papers
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.1 | — | thin_film | resistivity | — | 2024 | T1 | 2402.14559 |
| 5.1 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.024802 |
| — | — | thin_film | susceptibility | d-wave | 2024 | T1 | 2402.14559 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2105.07783 |
| — | — | — | resistivity | — | 2020 | T1 | 2012.06560 |
Structure
- Crystal structure
- infinite-layer
- Phase
- infinite_layer
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.225