Tc max
18.0 K
Tc ambient
—
arXiv year
2019
Papers
12
Tc exp.
18.0 K
Tc theo.
—
Evidence
mixed
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevMaterials.8.084804
Evidence (13 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 18.0 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.084804 |
| 12.5 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.084804 |
Structure
- Crystal structure
- infinite-layer
- Phase
- infinite_layer
- Lattice a (Å)
- 3.910
- Lattice c (Å)
- 3.370
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- hole
- Doping level
- 0.175