Tc max
24.0 K
Tc ambient
24.0 K
arXiv year
1989
Papers
6
Tc exp.
24.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, polycrystal, DOI: 10.1103/PhysRevB.40.2617
Evidence (6 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 24.0 | ambient | polycrystal | — | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.2617 |
| — | — | thin_film | resistivity | — | 2016 | T1 | 1608.03006 |
| — | — | single_crystal | resistivity | — | 2011 | T1 | 1104.1165 |
| — | — | thin_film | resistivity | — | 2011 | T1 | 1109.6399 |
| — | — | single_crystal | ARPES | — | 2008 | T3 | 0807.3359 |
| — | — | single_crystal | resistivity | — | 2005 | T2 | cond-mat/0506681 |
Structure
- Crystal structure
- T'
- Phase
- cuprate_214
- Lattice a (Å)
- 3.948
- Lattice c (Å)
- 12.070
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.170