Tc max
26.0 K
Tc ambient
25.0 K
arXiv year
1989
Papers
50
Tc exp.
26.0 K
Tc theo.
24.0 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0805.0978, confirmed by 2 papers
Evidence (63 records from 50 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 26.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.0978 |
| 26.0 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.060505 |
| 25.0 | — |
Structure
- Crystal structure
- Nd2CuO4-type
- Space group
- I4/mmm
- Lattice a (Å)
- 3.930
- Lattice c (Å)
- 12.080
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- 1.14
Competing orders
- Competing order
- AFM
- T_AFM
- 85.0 K
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- single_crystal
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.150