Tc max
26.0 K
Tc ambient
25.0 K
arXiv year
1989
Papers
49
Tc exp.
26.0 K
Tc theo.
24.0 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0805.0978, confirmed by 2 papers
Evidence (62 records from 49 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 26.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.0978 |
| 26.0 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.060505 |
| 25.0 | — | single_crystal | susceptibility, neutron | d-wave | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172505 |
| 25.0 | — | — | susceptibility | — | 2008 | T2 | 0803.3250 |
| 25.0 | ambient | single_crystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.224514 |
| 25.0 | — | single_crystal | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.104508 |
| 25.0 | — | single_crystal | susceptibility | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.137004 |
| 25.0 | — | single_crystal | neutron | — | 2002 | T1 | cond-mat/0210536 |
| 24.0 | ambient | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.014512 |
| 24.0 | — | single_crystal | ARPES | unknown | 2002 | T1 | DOI: 10.1103/PhysRevLett.88.257001 |
| 24.0 | — | single_crystal | susceptibility | d-wave | 2000 | T1 | DOI: 10.1103/PhysRevLett.85.3696 |
| 24.0 | — | single_crystal | — | d-wave | 2000 | T1 | cond-mat/0002300 |
| 24.0 | — | single_crystal | resistivity | d-wave | 2000 | T1 | cond-mat/0001166 |
| 24.0 | — | polycrystal | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.7656 |
| 24.0 | — | — | — | unknown | 1992 | T1 | DOI: 10.1103/PhysRevB.46.14321 |
| 24.0 | — | polycrystal | resistivity, susceptibility | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.62.1197 |
| 23.5 | — | — | specific_heat | — | 2010 | — | 1008.2092 |
| 23.5 | — | single_crystal | susceptibility | — | 2009 | T1 | 0906.1431 |
| 23.5 | — | single_crystal | susceptibility | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.157002 |
| 23.0 | — | single_crystal | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.217002 |
| 23.0 | — | — | — | — | 2012 | T1 | 1208.0960 |
| 23.0 | — | — | susceptibility | — | 2008 | T1 | 0808.0559 |
| 23.0 | — | single_crystal | susceptibility | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.117006 |
| 23.0 | — | single_crystal | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.104508 |
| 23.0 | — | single_crystal | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.4494 |
| 22.0 | — | single_crystal | susceptibility, resistivity | d-wave | 2002 | T1 | DOI: 10.1103/PhysRevLett.88.107002 |
| 20.0 | — | thin_film | resistivity | d-wave | 2005 | T1 | cond-mat/0503429 |
| 19.2 | — | single_crystal | susceptibility | — | 2009 | T1 | 0906.1431 |
| 19.2 | — | single_crystal | susceptibility | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.157002 |
| 19.0 | — | single_crystal | — | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.161114 |
| 18.0 | — | single_crystal | susceptibility | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.137004 |
| 18.0 | — | single_crystal | neutron | — | 2002 | T1 | cond-mat/0210536 |
| 18.0 | — | single_crystal | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.16737 |
| 14.0 | — | single_crystal | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.16737 |
| 13.0 | — | thin_film | resistivity | d-wave | 2005 | T1 | cond-mat/0503429 |
| 11.8 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0303507 |
| 11.0 | — | single_crystal | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.16737 |
| 10.0 | — | — | specific_heat | — | 2010 | — | 1008.2092 |
| 7.0 | — | single_crystal | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.104508 |
| 7.0 | — | single_crystal | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.16737 |
| 5.9 | — | single_crystal | susceptibility | — | 2009 | T1 | 0906.1431 |
| 5.9 | — | single_crystal | susceptibility | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.157002 |
| — | — | thin_film | resistivity | — | 2025 | — | 2502.17127 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2410.00488 |
| — | — | — | ARPES | — | 2023 | — | 2308.05313 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2105.04969 |
| — | — | thin_film | — | — | 2020 | T1 | 2012.13399 |
| — | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.054504 |
| — | — | single_crystal | resistivity | unknown | 2015 | T1 | DOI: 10.1103/PhysRevB.92.094501 |
| — | — | single_crystal | — | — | 2014 | T1 | DOI: 10.1103/PhysRevB.90.140504 |
| — | — | single_crystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.105.247002 |
| — | — | thin_film | resistivity | — | 2010 | T2 | 1010.0082 |
| — | — | single_crystal | resistivity | — | 2010 | T1 | 1008.3371 |
| — | — | thin_film | resistivity | d-wave | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.067011 |
| — | — | single_crystal | — | — | 2005 | — | cond-mat/0510470 |
| — | — | single_crystal | susceptibility | d-wave | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214510 |
| — | — | — | — | d-wave | 2000 | T1 | cond-mat/0004453 |
| — | — | single_crystal | resistivity | — | 1999 | T3 | cond-mat/9910102 |
| — | — | thin_film | resistivity | unknown | 1998 | T1 | DOI: 10.1103/PhysRevB.58.8800 |
| — | — | thin_film | susceptibility | — | 1997 | T1 | DOI: 10.1103/PhysRevB.55.9098 |
| — | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.8725 |
| — | — | polycrystal | resistivity, susceptibility | — | 1990 | T1 | DOI: 10.1103/PhysRevB.41.187 |
Structure
- Crystal structure
- Nd2CuO4-type
- Space group
- I4/mmm
- Lattice a (Å)
- 3.930
- Lattice c (Å)
- 12.080
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- 1.14
Competing orders
- Competing order
- AFM
- T_AFM
- 85.0 K
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- single_crystal
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.150