Tc max
24.0 K
Tc ambient
—
arXiv year
1998
Papers
3
Tc exp.
24.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.63.144511
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 24.0 | — | thin_film | resistivity | unknown | 2001 | T1 | DOI: 10.1103/PhysRevB.63.144511 |
| 21.3 | — | thin_film | resistivity | s-wave | 1999 | T1 | DOI: 10.1103/PhysRevB.60.12424 |
| 21.3 |
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping type
- electron
- Doping level
- 0.155