Tc max
32.5 K
Tc ambient
25.0 K
arXiv year
2008
Papers
8
Tc exp.
32.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.79.100508
Evidence (8 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 32.5 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.100508 |
| 29.0 | — | — | — | — | 2008 | T1 | 0811.1857 |
| 25.0 | — |
Structure
- Crystal structure
- T'-structure
- Space group
- I4/mmm
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping level
- 0.000