Tc max
4.4 K
Tc ambient
4.4 K
arXiv year
2018
Papers
2
Tc exp.
4.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:1804.09890
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.4 | — | thin_film | STM | anisotropic s-wave | 2018 | T1 | 1804.09890 |
| 4.2 | — | thin_film | STM | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.97.134524 |
Structure
- Crystal structure
- Pseudo-orthorhombic
- Space group
- F12/m1
- Lattice a (Å)
- 14.120
- Lattice c (Å)
- 5.320
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3