Tc max
7.2 K
Tc ambient
7.2 K
arXiv year
1986
Papers
398
Tc exp.
7.3 K
Tc theo.
8.0 K
Evidence
experimental
Tc max measured at ambient, thin_film, resistivity, DOI: 10.1103/PhysRevLett.57.2195, confirmed by 9 papers
Evidence (480 records from 398 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 8.1 | — | — | — | s-wave | 1998 | T2 | cond-mat/9803348 |
| 8.0 | — | — | — | — | 2010 | T2 | 1008.2822 |
| 8.0 | — | thin_film |
Structure
- Crystal structure
- fcc
- Space group
- Fm-3m
- Lattice a (Å)
- 4.891
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 1.7 T (at 1.6 K)
- λ_eph (e–ph coupling)
- 1.72
- ω_log
- 63 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- Co/Pt multilayer
- Pressure type
- none
- Doping type
- none