Tc max
4.8 K
Tc ambient
—
arXiv year
2004
Papers
2
Tc exp.
4.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.83.094503
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.8 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.83.094503 |
| — | — | polycrystal | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.060501 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —