Tc max
6.0 K
Tc ambient
6.0 K
arXiv year
1998
Papers
1
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/9806072
Evidence (2 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.0 | ambient | thin_film | resistivity | — | 1998 | — | cond-mat/9806072 |
| 5.5 | ambient | thin_film | resistivity | — | 1998 | — | cond-mat/9806072 |
Structure
- Crystal structure
- polycrystalline
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SiO_2