Tc max
6.2 K
Tc ambient
6.2 K
arXiv year
1993
Papers
2
Tc exp.
6.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.70.347
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.2 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevLett.70.347 |
| 4.3 | — | thin_film | resistivity | — | 2009 | T1 | 0911.1217 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiO2