Tc max
7.3 K
Tc ambient
7.2 K
arXiv year
1987
Papers
4
Tc exp.
7.3 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.40.175
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.3 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.175 |
| 7.2 | ambient | polycrystal | susceptibility | — | 2003 | T1 | cond-mat/0305595 |
| — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- glass
- Doping level
- 0.015