Tc max
7.2 K
Tc ambient
7.2 K
arXiv year
1987
Papers
16
Tc exp.
7.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1007.5252, confirmed by 3 papers
Evidence (16 records from 16 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.2 | — | thin_film | resistivity | — | 2011 | T1 | 1108.0851 |
| 7.2 | — | thin_film | resistivity | — | 2010 | T1 | 1007.5252 |
| 7.2 | ambient | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.3702 |
| 7.0 | — | polycrystal | resistivity | — | 2004 | T1 | cond-mat/0411715 |
| 7.0 | — | thin_film | resistivity | s-wave | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.147002 |
| 7.0 | — | wire | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.63.2417 |
| 6.9 | — | polycrystal | neutron | — | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.087002 |
| 4.7 | — | thin_film | resistivity | — | 2016 | T1 | 1611.06634 |
| — | — | polycrystal | muSR | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.104514 |
| — | — | polycrystal | neutron | — | 2003 | T1 | cond-mat/0301292 |
| — | — | polycrystal | — | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.4251 |
| — | — | thin_film | — | — | 1997 | T1 | DOI: 10.1103/PhysRevB.56.5564 |
| — | — | polycrystal | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevLett.79.2538 |
| — | — | polycrystal | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.7376 |
| — | — | wire | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.160 |
| — | — | thin_film | — | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.5267 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- sapphire
- Pressure type
- none