Tc max
3.6 K
Tc ambient
—
arXiv year
2002
Papers
5
Tc exp.
3.6 K
Tc theo.
0.5 K
Evidence
mixed
Tc max measured at susceptibility, arXiv:cond-mat/0308292, confirmed by 2 papers
Evidence (6 records from 5 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.6 | — | — | susceptibility | — | 2003 | T2 | cond-mat/0308292 |
| 0.9 | — | thin_film | resistivity | s-wave | 2011 | T1 | DOI: 10.1103/PhysRevB.83.174516 |
| 0.5 | ambient | — | — | — | 2005 | T1 | DOI: 10.1103/PhysRevB.71.012515 |
| 0.1 | ambient | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.1 | — | thin_film | resistivity | s-wave | 2011 | T1 | DOI: 10.1103/PhysRevB.83.174516 |
| — | — | — | — | — | 2025 | T3 | 2508.21281 |
Structure
- Crystal structure
- fcc
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.38
Samples & pressure
- Substrate
- SrS