Tc max
21.0 K
Tc ambient
21.0 K
Discovery
2000
Papers
2
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0405284, confirmed by 2 papers
Evidence (4 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Paper |
|---|---|---|---|---|---|---|
| 21.0 | ambient | thin_film | resistivity | — | 2004 | cond-mat/0405284 |
| 19.0 | ambient | single_crystal | resistivity | — | 2000 | cond-mat/0001166 |
| 15.0 | ambient | thin_film | resistivity | — | 2004 | cond-mat/0405284 |
| — | ambient | single_crystal | susceptibility | d-wave | 2000 | cond-mat/0001166 |
Structure
- Crystal structure
- K2NiF4-type
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO_3
- Doping type
- electron
- Doping level
- 0.150