Tc max
81.0 K
Tc ambient
81.0 K
arXiv year
1992
Papers
3
Tc exp.
81.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.69.2713, confirmed by 2 papers
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 81.0 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.2713 |
| 81.0 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.46.14309 |
| — |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping level
- 0.100