Tc max
50.0 K
Tc ambient
50.0 K
arXiv year
1992
Papers
3
Tc exp.
50.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.69.2713, confirmed by 2 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 50.0 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.2713 |
| 43.0 | — | single_crystal | susceptibility | — | 2025 | T2 | 2512.16423 |
| 37.0 | — | single_crystal | resistivity | — | 2025 | T2 | 2512.16423 |
| — | — | single_crystal | resistivity, susceptibility | s+d | 1997 | T2 | cond-mat/9709232 |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- single_crystal
- Substrate
- SrTiO3