Tc max
15.0 K
Tc ambient
10.8 K
arXiv year
2020
Papers
12
Tc exp.
15.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, arXiv:2109.05761, confirmed by 2 papers
Evidence (15 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 17.0 | — | thin_film | resistivity | — | 2024 | T1 | 2411.04896 |
| 15.0 | — | thin_film | resistivity | — | 2024 | T1 | 2411.04896 |
| 15.0 | — | thin_film | — | — | 2021 | T1 | 2109.05761 |
| 12.0 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.235126 |
| 10.8 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.115411 |
| 10.8 | — | thin_film | resistivity | — | 2023 | T1 | 2303.05094 |
| 10.1 | — | thin_film | susceptibility | d-wave | 2022 | T1 | 2201.12971 |
| 10.0 | — | thin_film | resistivity | — | 2024 | T1 | 2411.04896 |
| 9.5 | — | thin_film | — | — | 2020 | T1 | 2006.13369 |
| 7.8 | — | thin_film | resistivity | — | 2024 | T1 | 2402.14559 |
| 7.8 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.024802 |
| — | — | thin_film | — | — | 2024 | — | 2410.14341 |
| — | — | thin_film | susceptibility | d-wave | 2024 | T1 | 2402.14559 |
| — | — | thin_film | — | — | 2024 | T2 | 2401.12307 |
| — | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.121801 |
Structure
- Crystal structure
- infinite_layer
- Phase
- infinite_layer
- Lattice c (Å)
- 3.390
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- (LaAlO3)0.3(Sr2AlTaO6)0.7
- Doping type
- hole
- Doping level
- 0.200