Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2026
Papers
1
Tc exp.
2.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2607.16684
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.0 | — | thin_film | resistivity | — | 2026 | — | 2607.16684 |
Structure
- Phase
- infinite_layer
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.010