Tc max
14.0 K
Tc ambient
14.0 K
arXiv year
2020
Papers
2
Tc exp.
14.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevMaterials.4.121801, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 14.0 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.121801 |
| 14.0 | — | thin_film | resistivity | — | 2020 | T1 | 2010.16101 |
Structure
- Phase
- infinite_layer
- Lattice a (Å)
- 3.910
- Lattice c (Å)
- 3.440
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping level
- 0.180