Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2005
Papers
4
Tc exp.
2.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0902.1455, confirmed by 2 papers
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.0 | — | thin_film | resistivity | — | 2009 | — | 0902.1455 |
| 2.0 | — | thin_film | — | — | 2005 | T1 | cond-mat/0510085 |
| — | — | thin_film | resistivity | — | 2010 | T1 | 1008.1682 |
| — | — | thin_film | resistivity | d-wave | 2010 | T1 | DOI: 10.1103/PhysRevB.82.094508 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- LaSrGaO4
- Doping type
- electron
- Doping level
- 0.120