Tc max
26.0 K
Tc ambient
26.0 K
arXiv year
1995
Papers
53
Tc exp.
26.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0805.0978, confirmed by 3 papers
Evidence (85 records from 53 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 27.0 | — | single_crystal | susceptibility | s-wave | 1995 | T1 | DOI: 10.1103/PhysRevLett.74.4927 |
| 26.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.0978 |
| 26.0 |
Structure
- Crystal structure
- tetragonal
- Space group
- I4/mmm
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- Hc2
- 73.0 T (0 K, H parallel ab-plane)
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.150