Pr₂CuO₄±δ

cuprate · T'-structure

ambient SCunconventionaldisputed

Tc max

27.0 K

Tc ambient

27.0 K

arXiv year

2008

Papers

Tc exp.

27.0 K

Tc theo.

—

Evidence

experimental

Tc max measured at thin_film, resistivity, arXiv:1406.7258, confirmed by 3 papers

Evidence (21 records from 10 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
31.5	—	thin_film	resistivity	—	2009	T1	DOI: 10.1103/PhysRevB.79.100508
27.0	—	thin_film	resistivity, transmission	d-wave	2014	—	1406.7258
27.0	—	thin_film	resistivity	d-wave	2014	—	1412.2946
25.7	—	thin_film	resistivity	—	2015	T1	1510.04268
25.5	—	thin_film	resistivity	—	2018	T1	DOI: 10.1103/PhysRevB.98.020505
25.0	—	thin_film	resistivity	—	2015	T1	1510.04268
23.6	—	thin_film	resistivity	—	2017	T1	DOI: 10.1103/PhysRevB.96.104518
21.9	—	thin_film	resistivity	—	2018	T1	1807.01087
21.2	—	thin_film	resistivity	—	2018	T1	1807.01087
19.3	—	thin_film	resistivity	—	2017	T1	DOI: 10.1103/PhysRevB.96.104518
18.9	—	thin_film	resistivity	—	2018	T1	1807.01087
18.7	—	thin_film	resistivity	—	2018	T1	1807.01087
17.8	—	thin_film	resistivity	—	2017	T1	DOI: 10.1103/PhysRevB.96.104518
16.4	—	thin_film	resistivity	—	2017	T1	DOI: 10.1103/PhysRevB.96.104518
15.5	—	thin_film	resistivity	—	2017	T1	DOI: 10.1103/PhysRevB.96.104518
11.0	—	thin_film	resistivity	—	2018	T1	1807.01087
2.7	—	thin_film	resistivity	—	2018	T1	1807.01087
2.5	—	thin_film	resistivity	—	2018	T1	1807.01087
—	—	thin_film	resistivity	—	2019	T1	1906.07360
—	—	thin_film	resistivity	—	2012	T1	DOI: 10.1103/PhysRevB.85.184502
—	—	thin_film	—	—	2008	—	0811.1077