Tc max
92.0 K
Tc ambient
92.0 K
arXiv year
1996
Papers
5
Tc exp.
92.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.54.6122, confirmed by 3 papers
Evidence (5 records from 5 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 92.0 | — | thin_film | resistivity, susceptibility | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.6122 |
| 90.0 | — | polycrystal | susceptibility | — | 1999 | T1 | cond-mat/9909086 |
| 90.0 | — | — | — | — | 1998 | T1 | cond-mat/9805225 |
| — | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024505 |
| — | — | — | muSR | — | 2011 | T1 | 1112.2879 |
Structure
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3