Tc max
0.6 K
Tc ambient
0.6 K
arXiv year
1999
Papers
8
Tc exp.
0.6 K
Tc theo.
0.6 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:cond-mat/0202467, confirmed by 3 papers
Evidence (8 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.0 | — | thin_film | resistivity | — | 2026 | — | 2606.07848 |
| 0.6 | — | — | — | — | 2006 | T2 | cond-mat/0601142 |
| 0.6 | — | thin_film | resistivity | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Silicon