Tc max
0.6 K
Tc ambient
0.6 K
arXiv year
1999
Papers
7
Tc exp.
0.6 K
Tc theo.
0.6 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1008.3590, confirmed by 4 papers
Evidence (7 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.6 | — | — | — | — | 2006 | T2 | cond-mat/0601142 |
| 0.6 | — | thin_film | resistivity | — | 2010 | T1 | 1008.3590 |
| 0.6 | — | thin_film | resistivity | — | 2002 | T3 | cond-mat/0202467 |
| 0.5 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.11340 |
| 0.5 | — | thin_film | resistivity | — | 1999 | T1 | cond-mat/9907247 |
| — | — | — | — | — | 2022 | T1 | 2209.02721 |
| — | — | wire | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.150405 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si