Tc max
0.6 K
Tc ambient
0.6 K
Discovery
1999
Papers
2
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0202467, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Paper |
|---|---|---|---|---|---|---|
| 0.6 | ambient | thin_film | resistivity | — | 2002 | cond-mat/0202467 |
| 0.5 | ambient | thin_film | resistivity | — | 1999 | cond-mat/9907247 |
Structure
- Crystal structure
- polycrystalline
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si