Re₆Zr

conventional · α-Mn

ambient SCunconventionaldisputed

Tc max

6.8 K

Tc ambient

6.8 K

arXiv year

2014

Papers

Tc exp.

6.8 K

Tc theo.

—

Evidence

experimental

Tc max measured at single_crystal, resistivity, DOI: 10.1103/PhysRevB.97.224506, confirmed by 2 papers

Evidence (16 records from 12 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
6.8	—	single_crystal	resistivity, susceptibility, specific_heat	s-wave	2018	T1	DOI: 10.1103/PhysRevB.97.224506
6.8	—	single_crystal	resistivity, susceptibility, specific_heat	s-wave	2018	T3	1806.03768
6.8	—	polycrystal	muSR	s-wave	2014	T1	1401.2108
6.8	ambient	polycrystal	resistivity	—	2017	T1	1709.01328
6.8	—	polycrystal	resistivity, specific_heat	s-wave	2017	T1	DOI: 10.1103/PhysRevB.96.064521
6.8	ambient	polycrystal	specific_heat, magnetization	s-wave	2017	T1	1709.01328
6.8	—	polycrystal	susceptibility, specific_heat, muSR	s-wave	2014	T1	DOI: 10.1103/PhysRevLett.112.107002
6.8	—	polycrystal	magnetization, specific_heat	—	2014	T1	1401.2108
6.7	—	polycrystal	susceptibility	s-wave	2016	T1	DOI: 10.1103/PhysRevB.94.214513
6.7	—	polycrystal	susceptibility	s-wave	2016	T1	1612.02520
6.7	—	polycrystal	susceptibility	s-wave	2017	T1	DOI: 10.1103/PhysRevB.96.064521
6.7	—	polycrystal	resistivity	—	2016	T1	DOI: 10.1103/PhysRevB.94.144515
6.6	—	polycrystal	susceptibility	—	2016	T1	DOI: 10.1103/PhysRevB.94.144515
5.9	—	thin_film	resistivity	s-wave	2020	T1	2012.12058
4.7	—	thin_film	resistivity	—	2023	T1	DOI: 10.1103/PhysRevB.108.L180503
—	—	single_crystal	—	unknown	2017	T2	1704.06166