Tc max
0.5 K
Tc ambient
0.5 K
arXiv year
2006
Papers
4
Tc exp.
0.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2503.00233, confirmed by 3 papers
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.6 | — | thin_film | resistivity | — | 2025 | — | 2503.00233 |
| 0.5 | — | single_crystal | resistivity | s-wave | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.247004 |
| 0.4 | — | — | tunneling | unknown | 2006 | — | cond-mat/0608066 |
| 0.4 | — | thin_film | resistivity | — | 2025 | — | 2503.00233 |
| — | ambient | — | — | — | 2026 | T2 | 2601.13292 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —