Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2020
Papers
7
Tc exp.
2.0 K
Tc theo.
—
Evidence
mixed
Tc max measured at thin_film, arXiv:2201.07297
Evidence (10 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.0 | — | thin_film | — | — | 2022 | — | 2201.07297 |
| 1.8 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.147001 |
| 1.7 | — | thin_film | resistivity |
Structure
- Crystal structure
- rutile
- Space group
- P4_2/mnm
Superconducting parameters
- Pairing symmetry
- p-wave
- Hc2
- 4.0 T (in-plane, base temperature)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- TiO2 and MgF2