Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2020
Papers
6
Tc exp.
2.0 K
Tc theo.
—
Evidence
mixed
Tc max measured at thin_film, arXiv:2201.07297, confirmed by 2 papers
Evidence (8 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.0 | — | thin_film | — | — | 2022 | — | 2201.07297 |
| 1.8 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.147001 |
| 1.7 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.147001 |
| 1.6 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.147001 |
| — | — | — | — | p-wave | 2024 | T1 | 2401.11028 |
| — | — | — | — | p-wave | 2023 | T3 | 2306.06612 |
| — | — | — | — | — | 2022 | T3 | 2205.00060 |
| — | — | thin_film | — | — | 2020 | — | 2008.12529 |
Structure
- Crystal structure
- rutile
Superconducting parameters
- Pairing symmetry
- p-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- TiO2 and MgF2