Tc max
3.1 K
Tc ambient
—
arXiv year
2018
Papers
1
Tc exp.
3.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, STM, DOI: 10.1103/PhysRevB.98.134505
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.1 | — | thin_film | STM | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.134505 |
Superconducting parameters
- Gap structure
- multi_gap
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(111)