Tc max
2.8 K
Tc ambient
—
arXiv year
2011
Papers
2
Tc exp.
2.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.107.207001
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.8 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevLett.107.207001 |
| 1.4 | — | thin_film | STM | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.041410 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(111)