Tc max
100.0 K
Tc ambient
—
arXiv year
2006
Papers
8
Tc exp.
—
Tc theo.
100.0 K
Evidence
theoretical
Tc max measured at theoretical (DFT/computational), arXiv:1507.03921, confirmed by 2 papers
Evidence (13 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 166.0 | 202.0 | — | — | — | 2006 | T1 | DOI: 10.1103/PhysRevLett.96.017006 |
| 100.0 | — | — | — | — | 2015 | T2 | 1507.03921 |
| 75.0 | 60.0 | — | — | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.077002 |
| 53.0 | 125.0 | — | Eliashberg | — | 2017 | T1 | 1708.08870 |
| 51.6 | 250.0 | — | — | — | 2013 | T1 | 1302.3050 |
| 50.0 | — | — | — | — | 2008 | T2 | 0803.2713 |
| 20.6 | 250.0 | — | — | — | 2013 | T1 | 1302.3050 |
| 20.0 | 150.0 | — | — | — | 2010 | T1 | 1008.2820 |
| 20.0 | 200.0 | — | — | — | 2010 | T1 | 1008.2820 |
| 17.0 | 150.0 | — | — | — | 2010 | T1 | 1008.2820 |
| 17.0 | 200.0 | — | — | — | 2010 | T1 | 1008.2820 |
| 17.0 | 70.0 | — | — | — | 2010 | T1 | 1008.2820 |
| 16.5 | 190.0 | — | — | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.087005 |
Hydride Tc parameters (52)
independent NER enrichment for pressure, λ, μ*, and ω_log| Formula | Tc (K) | P (GPa) | λ | μ* | ω_log (K) | Method | Year | Paper |
|---|---|---|---|---|---|---|---|---|
| SiH4 | 17.5 | 60.0 | — | — | — | resistivity | 2009 | DOI: 10.1103/PhysRevLett.102.087005 |
| SiH4 | 75.0 | 70.0 | — | 0.10 | — | Allen-Dynes | 2008 | 0803.2713 |
| SiH4 | 46.6 | 70.0 | — | 0.10 | — | Allen-Dynes | 2008 | 0803.2713 |
| SiH4 | 17.0 | 70.0 | 1.17 | — | — | DFT | 2010 | 1008.2820 |
| SiH4 | 17.5 | 96.0 | — | — | — | resistivity | 2013 | 1302.3050 |
| SiH4 | 17.0 | 96.0 | — | — | — | resistivity | 2024 | 2409.16070 |
| SiH4 | 17.0 | 96.0 | — | — | — | resistivity | 2020 | DOI: 10.1103/PhysRevB.102.184103 |
| SiH4 | 17.0 | 96.0 | — | — | — | cited | 2018 | 1804.08224 |
| SiH4 | 17.0 | 96.0 | — | — | — | resistivity | 2015 | 1510.05264 |
| SiH4 | 17.0 | 100.0 | — | — | — | resistivity | 2024 | 2406.11344 |
| SiH4 | 17.0 | 100.0 | — | — | — | resistivity | 2015 | 1504.01349 |
| SiH4 | 17.0 | 100.0 | — | — | — | cited | 2015 | 1510.04415 |
| SiH4 | 17.0 | 100.0 | — | — | — | resistivity | 2010 | 1008.2820 |
| SiH4 | 17.0 | 105.0 | — | — | — | resistivity | 2011 | DOI: 10.1103/PhysRevLett.107.117002 |
| SiH4 | 17.0 | 105.0 | — | — | — | resistivity | 2011 | 1104.2313 |
| SiH4 | 17.0 | 108.0 | — | — | — | resistivity | 2017 | 1708.04095 |
| SiH4 | 17.0 | 108.0 | — | — | — | resistivity | 2017 | DOI: 10.1103/PhysRevB.96.064517 |
| SiH4 | 17.0 | 108.0 | — | — | — | resistivity | 2013 | 1303.1641 |
| SiH4 | 17.0 | 108.0 | — | — | — | resistivity | 2012 | 1210.1820 |
| SiH4 | 17.0 | 108.0 | — | — | — | resistivity | 2008 | DOI: 10.1103/PhysRevLett.101.107002 |
| SiH4 | 17.0 | 113.0 | — | — | — | resistivity | 2015 | 1507.03921 |
| SiH4 | 55.0 | 125.0 | — | — | — | DFT | 2024 | 2409.16070 |
| SiH4 | 53.0 | 125.0 | 0.89 | 0.10 | 917 | Eliashberg | 2017 | 1708.08870 |
| SiH4 | 50.0 | 125.0 | — | — | — | DFT | 2008 | 0804.4812 |
| SiH4 | 50.0 | 125.0 | — | — | — | DFT | 2008 | 0803.2713 |
| SiH4 | 50.0 | 125.0 | — | — | — | DFT | 2008 | DOI: 10.1103/PhysRevLett.101.077002 |
| SiH4 | 20.0 | 150.0 | — | — | — | DFT | 2024 | 2409.16070 |
| SiH4 | 20.0 | 150.0 | — | 0.10 | — | Eliashberg | 2010 | 1008.2820 |
| SiH4 | 20.0 | 150.0 | — | 0.10 | — | Allen-Dynes | 2008 | DOI: 10.1103/PhysRevLett.101.077002 |
| SiH4 | 17.0 | 150.0 | 0.62 | — | — | DFT | 2010 | 1008.2820 |
| SiH4 | 16.5 | 190.0 | — | — | — | DFT | 2024 | 2409.16070 |
| SiH4 | 16.5 | 190.0 | 0.58 | 0.13 | — | Allen-Dynes | 2009 | DOI: 10.1103/PhysRevLett.102.087005 |
| SiH4 | 71.0 | 200.0 | — | — | — | DFT | 2023 | 2312.12694 |
| SiH4 | 47.7 | 200.0 | — | 0.10 | — | Allen-Dynes | 2008 | 0803.2713 |
| SiH4 | 20.0 | 200.0 | — | 0.10 | — | Eliashberg | 2010 | 1008.2820 |
| SiH4 | 17.0 | 200.0 | 0.75 | — | — | DFT | 2010 | 1008.2820 |
| SiH4 | 3.0 | 200.0 | — | — | — | resistivity | 2010 | 1008.2820 |
| SiH4 | 166.0 | 202.0 | — | — | — | DFT | 2019 | DOI: 10.1103/PhysRevB.99.214504 |
| SiH4 | 166.0 | 202.0 | — | — | — | cited | 2018 | 1804.08224 |
| SiH4 | 166.0 | 202.0 | — | — | — | DFT | 2008 | 0803.2713 |
| SiH4 | 166.0 | 202.0 | — | — | — | DFT | 2008 | 0804.4812 |
| SiH4 | 166.0 | 202.0 | — | — | — | DFT | 2008 | DOI: 10.1103/PhysRevLett.101.077002 |
| SiH4 | 166.0 | 202.0 | — | — | — | DFT | 2006 | DOI: 10.1103/PhysRevLett.96.017006 |
| SiH4 | 16.0 | 220.0 | — | — | — | DFT | 2009 | DOI: 10.1103/PhysRevLett.102.087005 |
| SiH4 | 80.0 | 250.0 | — | 0.10 | — | Allen-Dynes | 2008 | 0803.2713 |
| SiH4 | 51.6 | 250.0 | 0.91 | 0.10 | 840 | Eliashberg | 2013 | 1302.3050 |
| SiH4 | 20.6 | 250.0 | 0.91 | 0.30 | 840 | Eliashbergcheck | 2013 | 1302.3050 |
| SiH4 | 72.0 | 300.0 | — | — | — | DFT | 2023 | 2312.12694 |
| SiH4 | 35.1 | 300.0 | — | — | — | DFT | 2024 | 2409.16070 |
| SiH4 | 26.1 | 300.0 | — | 0.10 | — | Allen-Dynes | 2008 | 0803.2713 |
| SiH4 | 35.0 | 400.0 | — | — | — | DFT | 2024 | 2409.16070 |
| SiH4 | 47.5 | — | — | 0.10 | — | Allen-Dynes | 2008 | DOI: 10.1103/PhysRevLett.101.077002 |
Structure
- Crystal structure
- layered
- Space group
- Cmca
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.58
- ω_log
- 840 K
Samples & pressure
- Pressure type
- hydrostatic