Tc max
16.0 K
Tc ambient
16.0 K
arXiv year
2025
Papers
1
Tc exp.
16.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/j8v5-vl1c
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 16.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/j8v5-vl1c |
Structure
- Phase
- infinite_layer
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.42
Samples & pressure
- Sample form
- thin_film
- Substrate
- (La,Sr)(Al,Ta)O3