Tc max
55.0 K
Tc ambient
—
arXiv year
2011
Papers
4
Tc exp.
55.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.84.024521
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 55.0 | — | polycrystal | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.024521 |
| 48.0 | — | thin_film | susceptibility | — | 2019 | T1 | 1903.11819 |
| 48.0 |
Structure
- Crystal structure
- tetragonal ZrCuSiAs-type
- Space group
- P4/nmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgO
- Doping type
- electron
- Doping level
- 0.350