Tc max
55.0 K
Tc ambient
47.0 K
arXiv year
2010
Papers
7
Tc exp.
55.0 K
Tc theo.
54.3 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1804.02021, confirmed by 2 papers
Evidence (8 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 55.0 | — | thin_film | resistivity | — | 2018 | — | 1804.02021 |
| 55.0 | — | thin_film | susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.087001 |
| 54.3 | — | — | — | — | 2025 | T3 | 2601.06083 |
| 54.0 | — | single_crystal | resistivity | — | 2017 | T1 | 1709.01777 |
| 54.0 | ambient | single_crystal | resistivity | — | 2010 | T1 | 1003.3612 |
| 47.0 | — | — | — | — | 2012 | T3 | 1205.4557 |
| 42.2 | — | — | — | — | 2025 | T3 | 2601.06083 |
| — | — | single_crystal | resistivity | — | 2014 | T1 | 1410.7731 |
Structure
- Crystal structure
- tetragonal
- Space group
- P4/nmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- CaF2
- Doping type
- electron