Tc max
4.5 K
Tc ambient
4.5 K
arXiv year
2015
Papers
2
Tc exp.
4.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, susceptibility, arXiv:1505.03621, confirmed by 2 papers
Evidence (5 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.5 | — | thin_film | susceptibility | p-wave | 2016 | T1 | DOI: 10.1103/PhysRevB.94.024106 |
| 4.5 | — | thin_film | susceptibility | p-wave | 2015 | T1 | 1505.03621 |
| 3.0 | — | thin_film | resistivity | p-wave | 2016 | T1 | DOI: 10.1103/PhysRevB.94.024106 |
| 3.0 | — | thin_film | resistivity | p-wave | 2015 | T1 | 1505.03621 |
| 0.7 | — | thin_film | resistivity | p-wave | 2016 | T1 | DOI: 10.1103/PhysRevB.94.024106 |
Superconducting parameters
- Pairing symmetry
- p-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- AlN or GaN
- Doping type
- electron